Philipp Lukas Danylak, M.Sc.

Philipp Lukas Danylak, M.Sc.

  • Kaiserstraße 89
    76133 Karlsruhe

Work Experience

  

  • Since 09/2021: Research associate in the Critical Information Infrastructures research group at Karlsruhe Institute of Technology
  • 06/2020 - 05/2021: Working student (IT sourcing) at Dr. Fochler & Company GmbH
  • 12/2017 - 06/2018: Working student (professional consultation) at Allianz Deutschland AG
  • 10/2016 - 03/2017: Intern (project management) at Dürr Systems AG

Education

  • 10/2018 - 08/2021: Master of Science in Industrial Engineering and Management at Karlsruhe Institute of Technology
    08/2019 - 01/2020: Master of Science in Industrial Engineering and Management (Erasmus+) at Linköpings Universitet, Sweden
    10/2014 - 09/2018: Bachelor of Science in Industrial Engineering and Management at Karlsruhe Institute of Technology

Research Interests

  • IT Certifications
  • Cybersecurity
  • Privacy

Publikationsliste


DIRECTIONS-Kriterienkatalog: Fassung 0.7, Stand 12.06.2024
Brecker, K.; Danylak, P.; Helmke, J. T.; Hornung, G.; Kohpeiß, M.; Link, H.; Lins, S.; Schild, H.-H.; Schindler, S.; Späthe, E.; Sunyaev, A.
2024. Bundesministerium für Bildung und Forschung (BMBF). doi:10.5445/IR/1000172025
Making Sense of Certification Internalization: A Process Model for Implementing Information Security and Data Protection Certifications
Danylak, P.; Lins, S.; Hsu, C.; Sunyaev, A.
2022. Proceedings of the 17th Pre-ICIS Workshop on Information Security and Privacy (WISP 2022), 1855–1
Certifications to Safeguard Data Protection Standards? How Superficial Internalization Thwarts the Plan
Danylak, P.; Brecker, K.; Lins, S.; Sunyaev, A.
2022, October 13. Forum Privatheit (2022), Berlin, Germany, October 13–14, 2022
Toward a Unified Framework for Information Systems Certification Internalization
Danylak, P.; Lins, S.; Greulich, M.; Sunyaev, A.
2022. 24th IEEE Conference on Business Informatics (IEEE CBI 2022), 15th-17th June 2022, 186–195, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/CBI54897.2022.00027